Calander Home 2001-2002 2002-2003 January 28 - Greg Haugstad Micro- to Nano-Scale Physical Characterization of Biomaterials: AtomicForce Microscopy and Other Scanning Probe Methods Date: 1/28/02 Time: Noon to 1PM Place: BSBE 6-101 Greg Haugstad, Senior Research Associate and Director of the IT Characterization Facility will present: Micro- to Nano-Scale Physical Characterization of Biomaterials: AtomicForce Microscopy and Other Scanning Probe Methods. This talk is an overview of scanning probe microscopy (SPM) techniquesas applied to biomolecular and cellular systems. The operating principlesof the most common SPMs, contact- and "tapping"-mode atomic forcemicroscopy (AFM), are covered in some detail, along with common limitations, artifacts and pitfalls. Not only imaging but also quantitative physical characterization is discussed. In the course of one decade theinternational SPM community has developed a broad range of measurements andtheoretical interpretations. The physical information derived relates not only to mechanical response but also to chemical, electrochemical, electrical, electrostatic, magnetic, optical and other properties. Select examplesare presented from the literature as well as the speaker's research collaborations.